[IEEE 2002 IEEE International Reliability Physics Symposium Proceedings. 40th Annual - Dallas, TX, USA (7-11 April 2002)] 2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320) - RF MEMS switches and applications
- 作者Newman, H.S.
- 文件大小403.89KB
- 发表时间2002
- DOI10.1109/RELPHY.2002.996618
- 页码111-115
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