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Binding Energy of Negatively Charged Exciton in a Semiconductor Quantum Well: The Role of Interface Defects

Binding Energy of Negatively Charged Exciton in a Semiconductor Quantum Well: The Role of Interface Defects

L.C.O. Dacal; R. Ferreira; G. Bastard; J.A. Brum
  • 作者L.C.O. Dacal; R. Ferreira; G. Bastard; J.A. Brum
  • 卷第190卷
  • 期第3期
  • 印刷ISSN1862-6319
  • 文件大小72.51KB
  • 发表时间2002
  • DOI10.1002/1521-396x(200204)190:3<799::aid-pssa799>3.0.co;2-8
  • 页码799-802
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