Tagungsbericht - Materialwissenschaft und Werkstofftechnik 11/2002
- 卷第33卷
- 期第11期
- 印刷ISSN0933-5137
- 电子ISSN1521-4052
- 文件大小31.98KB
- 发表时间2002
- DOI10.1002/1521-4052(200211)33:11<695::aid-mawe695>3.0.co;2-o
- 页码695-695
Modern techniques for surface and thin film analysisV. Rupertus · 2006
Teilchenstrahlinduzierte Prozesse an dielektrischen OberflächenV. Rupertus; U. Rothhaar; P. Köpfer; A. Lorenz; H. Oechsner · 1993
Interface characterization of PICVD-coated polymer substratesV. Rupertus; K. Berresheim; C. Ottermann; S. Thiel; M. Kopnarski; K. Bange · 1997
A Quick Test To Monitor the Delamination Propensity of Glass ContainersRupertus, V.; Hladik, B.; Rothhaar, U.; Scheumann, V. · PDA Journal of Pharmaceutical Science and Technology · 2014
Analysis of sputter deposited and evaporated tantalum oxide layers on SiO2by SNMS, XPS, TDS and TRFAK. -H. Müller; V. Rupertus; H. Oechsner; V. Scheuer; T. Tschudi · 1989
XPS- and AES-investigations of electron and ion beam induced effects on SK16 glass surfacesU. Rothhaar; V. Rupertus; H. Oechsner · 1993
Characterization of ion-beam- and magnetron- sputtered YBa2Cu3O7−x high Tc superconducting films by secondary neutral mass spectrometry depth profilingC. Mössner; K.-D. Ufert; P. Köpfer; V. Rupertus; H. Oechsner · 1989