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[IEEE 2002 Annual Reliability and Maintainability Symposium (RAMS) - Seattle, WA, USA (28-31 Jan. 2002)] Annual Reliability and Maintainability Symposium. 2002 Proceedings (Cat. No.02CH37318) - An integrated measure of software maintainability

[IEEE 2002 Annual Reliability and Maintainability Symposium (RAMS) - Seattle, WA, USA (28-31 Jan. 2002)] Annual Reliability and Maintainability Symposium. 2002 Proceedings (Cat. No.02CH37318) - An integrated measure of software maintainability

Aggarwal, K.K.; Singh, Y.; Chhabra, J.K.

作者Aggarwal, K.K.; Singh, Y.; Chhabra, J.K.
文件大小631.34KB
发表时间2002
DOI10.1109/RAMS.2002.981648
页码235-241

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