[IEEE 2002 Annual Reliability and Maintainability Symposium (RAMS) - Seattle, WA, USA (28-31 Jan. 2002)] Annual Reliability and Maintainability Symposium. 2002 Proceedings (Cat. No.02CH37318) - Reliability estimation of hierarchical software systems
- 作者Leblanc, S.P.; Roman, P.A.
- 文件大小447.15KB
- 发表时间2002
- DOI10.1109/RAMS.2002.981650
- 页码249-253
[IEEE 1998 Symposium on VLSI Technology Digest of Technical Papers - Honolulu, HI, USA (1998.06.9-1998.06.11)] 1998 Symposium on VLSI Technology Digest of Technical Papers (Cat No 98CH36216) VLSIT-98 - 1998 Symposium on VLSI Technology Digest of Technical Papers (Cat. No.98CH36216)1998
[IEEE 1998 Symposium on VLSI Technology Digest of Technical Papers - Honolulu, HI, USA (1998.06.9-1998.06.11)] 1998 Symposium on VLSI Technology Digest of Technical Papers (Cat No 98CH36216) VLSIT-98 - Author index1998
[IEEE 1998 Symposium on VLSI Technology Digest of Technical Papers - Honolulu, HI, USA (1998.06.9-1998.06.11)] 1998 Symposium on VLSI Technology Digest of Technical Papers (Cat No 98CH36216) VLSIT-98 - Table of contents1998
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[IEEE 1998 Symposium on VLSI Technology Digest of Technical Papers - Honolulu, HI, USA (9-11 June 1998)] 1998 Symposium on VLSI Technology Digest of Technical Papers (Cat. No.98CH36216) - Electromigration of submicron Damascene copper interconnectsChangsup Ryu, ; Kee-Won Kwon, ; Loke, A.L.S.; Dubin, V.M.; Kavari, R.A.; Ray, G.W.; Wong, S.S. · 1998