New insights in polarity-dependent oxide breakdown for ultrathin gate oxide
- 期刊名称IEEE Electron Device Letters
- 作者Wu, E.; Sune, J.
- 卷第23卷
- 期第8期
- 印刷ISSN0741-3106
- 电子ISSN1558-0563
- 文件大小193.16KB
- 发表时间2002-08
- DOI10.1109/LED.2002.801293
- 页码494-496
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