发现好书期刊，享受阅读乐趣

海量图书期刊资源，随时随地畅享阅读乐趣

[IEEE 2002 Symposium on VLSI Technology Digest of Technical Papers - Honolulu, HI, USA (11-13 June 2002)] 2002 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.01CH37303) - Soft error rate scaling for emerging SOI technology options

[IEEE 2002 Symposium on VLSI Technology Digest of Technical Papers - Honolulu, HI, USA (11-13 June 2002)] 2002 Symposium on VLSI Technology. Digest of Technical Papers (Cat. No.01CH37303) - Soft error rate scaling for emerging SOI technology options

Oldiges, P.; Bernstein, K.; Heidel, D.; Klaasen, B.; Cannon, E.; Dennard, R.; Tang, H.; Ieong, M.; Wong, H.-S.P.
  • 作者Oldiges, P.; Bernstein, K.; Heidel, D.; Klaasen, B.; Cannon, E.; Dennard, R.; Tang, H.; Ieong, M.; Wong, H.-S.P.
  • 文件大小253.36KB
  • 发表时间2002
  • DOI10.1109/vlsit.2002.1015382
  • 页码46-47
同期刊推荐
← 返回【学霸图书馆】主页
© 2026 学霸图书馆 · 让阅读成为习惯