[IEEE 2002 IEEE International Reliability Physics Symposium Proceedings. 40th Annual - Dallas, TX, USA (7-11 April 2002)] 2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320) - SER reliability of 1TRAM designs
- 作者Sinitsky, D.; Peng, S.; Wang, J.; Ong, T.C.; Chen, E.; Fu-Chieh Hsu,
- 文件大小258.46KB
- 发表时间2002
- DOI10.1109/relphy.2002.996640
- 页码226-229
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