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[IEEE 2002 IEEE International Reliability Physics Symposium Proceedings. 40th Annual - Dallas, TX, USA (7-11 April 2002)] 2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320) - Digital Micromirror Device (DMD) hinge memory lifetime reliability modeling

[IEEE 2002 IEEE International Reliability Physics Symposium Proceedings. 40th Annual - Dallas, TX, USA (7-11 April 2002)] 2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320) - Digital Micromirror Device (DMD) hinge memory lifetime reliability modeling

Sontheimer, A.B.

作者Sontheimer, A.B.
文件大小310.76KB
发表时间2002
DOI10.1109/relphy.2002.996622
页码118-121

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