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[IEEE International Semiconductor Conference - Sinaia, Romania (8-12 Oct. 2002)] Proceedings. International Semiconductor Conference - Trap-assisted tunneling in MOS structures with ultrathin SiO/sub 2/

[IEEE International Semiconductor Conference - Sinaia, Romania (8-12 Oct. 2002)] Proceedings. International Semiconductor Conference - Trap-assisted tunneling in MOS structures with ultrathin SiO/sub 2/

Simeonov, S.; Yurukov, I.; Kafedjiiska, E.; Szekeres, A.

作者Simeonov, S.; Yurukov, I.; Kafedjiiska, E.; Szekeres, A.
卷第2卷
文件大小308.83KB
发表时间2002
DOI10.1109/smicnd.2002.1105877
页码399-402

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