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[IEEE 60th ARFTG Conference Digest Fall 2002. Automatic RF Techniques Group. Measurements Needs for Emerging Technologies - Washington, DC, USA (5-6 Dec. 2002)] 60th ARFTG Conference Digest, Fall 2002. - Identifying error-box parameters from the twelve-term vector network analyzer error model

[IEEE 60th ARFTG Conference Digest Fall 2002. Automatic RF Techniques Group. Measurements Needs for Emerging Technologies - Washington, DC, USA (5-6 Dec. 2002)] 60th ARFTG Conference Digest, Fall 2002. - Identifying error-box parameters from the twelve-term vector network analyzer error model

Vandenberghe, S.; Schreurs, D.; Carchon, G.; Nauwelaers, B.; De Raedt, W.

作者Vandenberghe, S.; Schreurs, D.; Carchon, G.; Nauwelaers, B.; De Raedt, W.
文件大小663.09KB
发表时间2002
DOI10.1109/arftgf.2002.1218697
页码157-165

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