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[IEEE 2002 2nd IEEE Conference on Nanotechnology - Washington, DC, USA (26-28 Aug. 2002)] Proceedings of the 2nd IEEE Conference on Nanotechnology - Failure analysis requirements for nanoelectronics

[IEEE 2002 2nd IEEE Conference on Nanotechnology - Washington, DC, USA (26-28 Aug. 2002)] Proceedings of the 2nd IEEE Conference on Nanotechnology - Failure analysis requirements for nanoelectronics

Vallett, D.P.

作者Vallett, D.P.
文件大小284.30KB
发表时间2002
DOI10.1109/nano.2002.1032131
页码89-92

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