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[IEEE IMTC/2002. 19th IEEE Instrumentation and Measurement Technology Conference - Anchorage, AK, USA (21-23 May 2002)] IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276) - Automatic selection of test frequencies for the diagnosis of soft faults in analog circuits

[IEEE IMTC/2002. 19th IEEE Instrumentation and Measurement Technology Conference - Anchorage, AK, USA (21-23 May 2002)] IMTC/2002. Proceedings of the 19th IEEE Instrumentation and Measurement Technology Conference (IEEE Cat. No.00CH37276) - Automatic selection of test frequencies for the diagnosis of soft faults in analog circuits

Alippi, C.; Catelani, M.; Fort, A.; Mugnaini, M.
  • 作者Alippi, C.; Catelani, M.; Fort, A.; Mugnaini, M.
  • 卷第2卷
  • 文件大小396.89KB
  • 发表时间2002
  • DOI10.1109/imtc.2002.1007181
  • 页码1503-1508
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