[IEEE 33rd Applied Imagery Pattern Recognition Workshop (AIPR'04) - Washington, DC, USA (13-15 Oct. 2004)] 33rd Applied Imagery Pattern Recognition Workshop (AIPR'04) - A Mammography Database and View System for the African American PatientsRoss, S.; Ejofodomi, O.; Jendoubi, A.; Chouikha, M.; Lo, B.; Wang, P.; Jianchao Zeng, · 2004