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[IEEE 23rd International Conference on Microelectronics (MIEL 2002) - Nis, Yugoslavia (12-15 May 2002)] 2002 23rd International Conference on Microelectronics. Proceedings (Cat. No.02TH8595) - Simulation of nanometer-scale MOSFET's with ultra-thin gate oxide including full 2-dimensional quantum mechanical effects and gate tunneling current

[IEEE 23rd International Conference on Microelectronics (MIEL 2002) - Nis, Yugoslavia (12-15 May 2002)] 2002 23rd International Conference on Microelectronics. Proceedings (Cat. No.02TH8595) - Simulation of nanometer-scale MOSFET's with ultra-thin gate oxide including full 2-dimensional quantum mechanical effects and gate tunneling current

Yutao Ma, ; Lifeng Chen, ; Jing Wang, ; Lilin Tian, ; Zhiping Yu, ; Litian Liu, ; Zhijian Li,
  • 作者Yutao Ma, ; Lifeng Chen, ; Jing Wang, ; Lilin Tian, ; Zhiping Yu, ; Litian Liu, ; Zhijian Li,
  • 卷第2卷
  • 文件大小333.60KB
  • 发表时间2002
  • DOI10.1109/miel.2002.1003292
  • 页码435-438
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