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[IEEE Proceedings of 39th Design Automation Conference - New Orleans, LA, USA (2002.6.10-2002.6.14)] Proceedings 2002 Design Automation Conference (IEEE Cat. No.02CH37324) - Wrapper/TAM co-optimization, constraint-driven test scheduling, and tester data volume reduction for SOCs

[IEEE Proceedings of 39th Design Automation Conference - New Orleans, LA, USA (2002.6.10-2002.6.14)] Proceedings 2002 Design Automation Conference (IEEE Cat. No.02CH37324) - Wrapper/TAM co-optimization, constraint-driven test scheduling, and tester data volume reduction for SOCs

Iyengar, V.; Chakrabarty, K.; Marinissen, E.J.

作者Iyengar, V.; Chakrabarty, K.; Marinissen, E.J.
文件大小766.83KB
发表时间2002
DOI10.1109/dac.2002.1012712
页码685-690

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