Microwave measurements of the absolute London penetration depth in double-sided YBa[sub 2]Cu[sub 3]O[sub 7−x] thin films on sapphire

• 作者A. G. Zaitsev; R. Schneider; G. Linker; F. Ratzel; R. Smithey; P. Schweiss; J. Geerk; R. Schwab; R. Heidinger
• 文件大小897.23KB
• 发表时间2002
• DOI10.1063/1.1435842