Submicron extreme ultraviolet imaging using high-harmonic radiation
- 期刊名称Applied Physics Letters
- 作者Wieland, Marek; Frueke, Rolf; Wilhein, Thomas; Spielmann, Christian; Pohl, Martin; Kleineberg, Ulf
- 卷第81卷
- 期第14期
- 印刷ISSN0003-6951
- 文件大小354.98KB
- 发表时间2002
- DOI10.1063/1.1511288
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