[IEEE IEEE 5th International Conference on Intelligent Transportation Systems. - Singapore (3-6 Sept. 2002)] Proceedings. The IEEE 5th International Conference on Intelligent Transportation Systems - Model predictive control with repeated model fitting for ramp metering
Bellemans, T.; De Schutter, B.; De Moor, B.
- 作者Bellemans, T.; De Schutter, B.; De Moor, B.
- 文件大小376.70KB
- 发表时间2002
- DOI10.1109/itsc.2002.1041221
- 页码236-241