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[IEEE 2002 IEEE Hong Kong Electron Devices Meeting - Hong Kong, China (22 June 2002)] Proceedings 2002 IEEE Hong Kong Electron Devices Meeting (Cat. No.02TH8616) - Electrical characteristics of novel hafnium oxide film

[IEEE 2002 IEEE Hong Kong Electron Devices Meeting - Hong Kong, China (22 June 2002)] Proceedings 2002 IEEE Hong Kong Electron Devices Meeting (Cat. No.02TH8616) - Electrical characteristics of novel hafnium oxide film

Ng, K.L.; Zhan, N.; Poon, M.C.; Kok, C.W.; Chan, M.; Wong, H.

作者Ng, K.L.; Zhan, N.; Poon, M.C.; Kok, C.W.; Chan, M.; Wong, H.
文件大小137.01KB
发表时间2002
DOI10.1109/hkedm.2002.1029155
页码51-54

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