[IEEE 2002 IEEE International Reliability Physics Symposium Proceedings. 40th Annual - Dallas, TX, USA (7-11 April 2002)] 2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320) - Modeling kinetics of gate oxide reliability using stretched exponents
Krishnan, M.S.; Kol'dyaev, V.
- 作者Krishnan, M.S.; Kol'dyaev, V.
- 文件大小235.47KB
- 发表时间2002
- DOI10.1109/relphy.2002.996676
- 页码421-422