发现好书期刊,享受阅读乐趣

海量图书期刊资源,随时随地畅享阅读乐趣

[IEEE 2002 IEEE International Reliability Physics Symposium Proceedings. 40th Annual - Dallas, TX, USA (7-11 April 2002)] 2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320) - Modeling kinetics of gate oxide reliability using stretched exponents

[IEEE 2002 IEEE International Reliability Physics Symposium Proceedings. 40th Annual - Dallas, TX, USA (7-11 April 2002)] 2002 IEEE International Reliability Physics Symposium. Proceedings. 40th Annual (Cat. No.02CH37320) - Modeling kinetics of gate oxide reliability using stretched exponents

Krishnan, M.S.; Kol'dyaev, V.
  • 作者Krishnan, M.S.; Kol'dyaev, V.
  • 文件大小235.47KB
  • 发表时间2002
  • DOI10.1109/relphy.2002.996676
  • 页码421-422
← 返回【学霸图书馆】主页