Dynamical Superfluid-Insulator Transition in a Chain of Weakly Coupled Bose-Einstein Condensates
- 期刊名称Physical Review Letters
- 作者Smerzi, A.; Trombettoni, A.; Kevrekidis, P. G.; Bishop, A. R.
- 卷第89卷
- 期第17期
- 印刷ISSN0031-9007
- 电子ISSN1079-7114
- 文件大小185.12KB
- 发表时间2002-10-3
- DOI10.1103/physrevlett.89.170402
[IEEE 2012 Joint Conf of 22nd Int'l Workshop on Software Measurement and the 7th Int'l Conference on Software Process and Product Measurement (IWSM-MENSURA) - Assisi, Italy (2012.10.17-2012.10.19)] 2012 Joint Conference of the 22nd International Workshop on Software Measurement and the 2012 Seventh International Conference on Software Process and Product Measurement - Conference Organization2012
[IEEE 2012 Joint Conf of 22nd Int'l Workshop on Software Measurement and the 7th Int'l Conference on Software Process and Product Measurement (IWSM-MENSURA) - Assisi, Italy (2012.10.17-2012.10.19)] 2012 Joint Conference of the 22nd International Workshop on Software Measurement and the 2012 Seventh International Conference on Software Process and Product Measurement - Reviewers2012
[IEEE 2012 Joint Conf of 22nd Int'l Workshop on Software Measurement and the 7th Int'l Conference on Software Process and Product Measurement (IWSM-MENSURA) - Assisi, Italy (2012.10.17-2012.10.19)] 2012 Joint Conference of the 22nd International Workshop on Software Measurement and the 2012 Seventh International Conference on Software Process and Product Measurement - Preface2012
[IEEE 2012 Joint Conf of 22nd Int'l Workshop on Software Measurement and the 7th Int'l Conference on Software Process and Product Measurement (IWSM-MENSURA) - Assisi, Italy (2012.10.17-2012.10.19)] 2012 Joint Conference of the 22nd International Workshop on Software Measurement and the 2012 Seventh International Conference on Software Process and Product Measurement - [Copyright notice]2012
[IEEE 2012 Joint Conf of 22nd Int'l Workshop on Software Measurement and the 7th Int'l Conference on Software Process and Product Measurement (IWSM-MENSURA) - Assisi, Italy (2012.10.17-2012.10.19)] 2012 Joint Conference of the 22nd International Workshop on Software Measurement and the 2012 Seventh International Conference on Software Process and Product Measurement - Committee Members2012
[IEEE 2012 Joint Conf of 22nd Int'l Workshop on Software Measurement and the 7th Int'l Conference on Software Process and Product Measurement (IWSM-MENSURA) - Assisi, Italy (2012.10.17-2012.10.19)] 2012 Joint Conference of the 22nd International Workshop on Software Measurement and the 2012 Seventh International Conference on Software Process and Product Measurement - Author index2012
[IEEE 2012 Joint Conf of 22nd Int'l Workshop on Software Measurement and the 7th Int'l Conference on Software Process and Product Measurement (IWSM-MENSURA) - Assisi, Italy (2012.10.17-2012.10.19)] 2012 Joint Conference of the 22nd International Workshop on Software Measurement and the 2012 Seventh International Conference on Software Process and Product Measurement - [Front cover]2012
[IEEE 2012 Joint Conf of 22nd Int'l Workshop on Software Measurement and the 7th Int'l Conference on Software Process and Product Measurement (IWSM-MENSURA) - Assisi, Italy (2012.10.17-2012.10.19)] 2012 Joint Conference of the 22nd International Workshop on Software Measurement and the 2012 Seventh International Conference on Software Process and Product Measurement - Keynote [2 abstracts]2012
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