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[IEEE Comput. Soc 2002 Design, Automation and Test in Europe Conference and Exhibition - Paris, France (4-8 March 2002)] Proceedings 2002 Design, Automation and Test in Europe Conference and Exhibition - Embedded robustness IPs

[IEEE Comput. Soc 2002 Design, Automation and Test in Europe Conference and Exhibition - Paris, France (4-8 March 2002)] Proceedings 2002 Design, Automation and Test in Europe Conference and Exhibition - Embedded robustness IPs

Dupont, E.; Nicolaidis, M.; Rohr, P.

作者Dupont, E.; Nicolaidis, M.; Rohr, P.
文件大小212.10KB
发表时间2002
DOI10.1109/date.2002.998279
页码244-245

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