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THE TRANSITION FROM AMORPHOUS SILICON OXIDE TO CRYSTALLINE SILICON STUDIED BY PHOTOELECTRON DIFFRACTION

THE TRANSITION FROM AMORPHOUS SILICON OXIDE TO CRYSTALLINE SILICON STUDIED BY PHOTOELECTRON DIFFRACTION

WESTPHAL, C.; DREINER, S.; SCHÜRMANN, M.; ZACHARIAS, H.

期刊名称Surface Review and Letters
作者WESTPHAL, C.; DREINER, S.; SCHÜRMANN, M.; ZACHARIAS, H.
卷第9卷
期第2期
印刷ISSN0218-625X
电子ISSN1793-6667
文件大小1501.06KB
发表时间2002-04
DOI10.1142/S0218625X02002725
页码735-740

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