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[IEEE 52nd Electronic Components and Technology Conference - San Diego, CA, USA (28-31 May 2002)] 52nd Electronic Components and Technology Conference 2002. (Cat. No.02CH37345) - Application of design of experiments methodology to model the effect of multiple parameters on simultaneous switching noise

[IEEE 52nd Electronic Components and Technology Conference - San Diego, CA, USA (28-31 May 2002)] 52nd Electronic Components and Technology Conference 2002. (Cat. No.02CH37345) - Application of design of experiments methodology to model the effect of multiple parameters on simultaneous switching noise

Zilaro, P.; Giotta, P.; Hawks, D.; Macias, C.

作者Zilaro, P.; Giotta, P.; Hawks, D.; Macias, C.
文件大小945.57KB
发表时间2002
DOI10.1109/ectc.2002.1008076
页码79-85

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