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Structural Comparison between Ge and GaAs Films Grown by Molecular Beam Epitaxy on Si Substrate

Yu, Guolin; Ebisu, Hiroshi; Rahman, Md. Mosaddeq ur; Soga, Tetsuo; Jimbo, Takashi; Umeno, Masayoshi

期刊名称Japanese Journal of Applied Physics
作者Yu, Guolin; Ebisu, Hiroshi; Rahman, Md. Mosaddeq ur; Soga, Tetsuo; Jimbo, Takashi; Umeno, Masayoshi
卷第41卷
印刷ISSN0021-4922
电子ISSN1347-4065
文件大小326.61KB
发表时间2002-2-15
DOI10.1143/JJAP.41.579
页码579-580