Transmission Electron Microscopy of the Configuration of Cracks and the Defect Structure near to Cracks in Si
- 期刊名称Defect and Diffusion Forum
- 作者Saka, Hiroyasu; Suprijadi,
- 电子ISSN1662-9507
- 文件大小2144.48KB
- 发表时间2002
- DOI10.4028/www.scientific.net/DDF.200-202.225
- 页码225-246
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