Diffusion Mechanisms: Two-Defect Models
- 期刊名称Solid State Phenomena
- 作者Neumann, Gerhard; Tuijn, C.
- 卷第88卷
- 电子ISSN1662-9779
- 文件大小295.42KB
- 发表时间2002
- DOI10.4028/www.scientific.net/SSP.88.21
- 页码21-25
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