Defects-induced volume deviations in ZnSe
H. Ebe; F. Sakurai; Z.Q. Chen; A. Uedono; B.-P. Zhang; Y. Segawa; K. Suto; Jun-ichi Nishizawa
- 作者H. Ebe; F. Sakurai; Z.Q. Chen; A. Uedono; B.-P. Zhang; Y. Segawa; K. Suto; Jun-ichi Nishizawa
- 印刷ISSN0022-0248
- 文件大小80.85KB
- 发表时间2002
- DOI10.1016/s0022-0248(01)02372-7
- 页码1566-1569