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Auger electron spectroscopy (AES) and electron energy loss spectroscopy (EELS) studies of GaP and Si surfaces

Auger electron spectroscopy (AES) and electron energy loss spectroscopy (EELS) studies of GaP and Si surfaces

E. Paparazzo; L. Moretto; Massimo Brolatti
  • 作者E. Paparazzo; L. Moretto; Massimo Brolatti
  • 卷第65卷
  • 期第2期
  • 印刷ISSN0042-207X
  • 文件大小369.86KB
  • 发表时间2002
  • DOI10.1016/s0042-207x(01)00481-x
  • 页码193-206
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