SPIE Proceedings [SPIE NDE For Health Monitoring and Diagnostics - San Diego, CA (Sunday 17 March 2002)] Nondestructive Evaluation and Reliability of Micro- and Nanomaterial Systems - Improving atomic force microscopy images with the adaptation of ultrasonic force microscopy
- 作者Druffner, Carl J.; Sathish, Shamachary; Meyendorf, Norbert; Baaklini, George Y.; Michel, Bernd
- 卷第4703卷
- 印刷ISSN0277-786X
- 文件大小529.15KB
- 发表时间2002
- DOI10.1117/12.469613
- 页码105-113
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