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[IEEE 23rd International Conference on Microelectronics (MIEL 2002) - Nis, Yugoslavia (12-15 May 2002)] 2002 23rd International Conference on Microelectronics. Proceedings (Cat. No.02TH8595) - Phase noise amplitude distribution as indicator of origin of random phase perturbation in a test oscillator

[IEEE 23rd International Conference on Microelectronics (MIEL 2002) - Nis, Yugoslavia (12-15 May 2002)] 2002 23rd International Conference on Microelectronics. Proceedings (Cat. No.02TH8595) - Phase noise amplitude distribution as indicator of origin of random phase perturbation in a test oscillator

Hadzi-Vukovic, J.; Jevtic, M.M.; Simic, D.

作者Hadzi-Vukovic, J.; Jevtic, M.M.; Simic, D.
卷第1卷
文件大小206.61KB
发表时间2002
DOI10.1109/miel.2002.1003197
页码301-304

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