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[IEEE Comput. Soc 2002 Design, Automation and Test in Europe Conference and Exhibition - Paris, France (4-8 March 2002)] Proceedings 2002 Design, Automation and Test in Europe Conference and Exhibition - Make your SOC design a winner: select the right memory IP
Ratford, V.
- 作者Ratford, V.
- 文件大小184.70KB
- 发表时间2002
- DOI10.1109/date.2002.998242
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