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Evaluation of microfracture location at elevated temperature by four-channel AE measurements using laser interferometer

Evaluation of microfracture location at elevated temperature by four-channel AE measurements using laser interferometer

M. Watanabe; M. Enoki; T. Kishi
  • 作者M. Watanabe; M. Enoki; T. Kishi
  • 卷第22卷
  • 期第15期
  • 印刷ISSN0261-8028
  • 电子ISSN1573-4811
  • 文件大小410.56KB
  • 发表时间2003-08-1
  • DOI10.1023/a:1024938908787
  • 页码1091-1093
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