Spectroscopic ellipsometry for characterization of organic semiconductor polymeric thin films

• 作者M. Losurdo; M.M. Giangregorio; P. Capezzuto; G. Bruno; F. Babudri; D. Colangiuli; G.M. Farinola; F. Naso
• 卷第138卷
• 印刷ISSN0379-6779
• 文件大小203.63KB
• 发表时间2003
• DOI10.1016/s0379-6779(02)01262-6