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Submicron ferroelectric domain structures tailored by high-voltage scanning probe microscopy

Submicron ferroelectric domain structures tailored by high-voltage scanning probe microscopy

Rosenman, G.; Urenski, P.; Agronin, A.; Rosenwaks, Y.; Molotskii, M.

期刊名称Applied Physics Letters
作者Rosenman, G.; Urenski, P.; Agronin, A.; Rosenwaks, Y.; Molotskii, M.
卷第82卷
期第1期
印刷ISSN0003-6951
文件大小357.33KB
发表时间2003
DOI10.1063/1.1534410

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