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[IEEE IEEE Symposium on Ultrasonics, 2003 - Honululu, HI, USA (Oct. 5-8, 2003)] IEEE Symposium on Ultrasonics, 2003 - Trade off study on different envelope detectors for B-mode imaging

[IEEE IEEE Symposium on Ultrasonics, 2003 - Honululu, HI, USA (Oct. 5-8, 2003)] IEEE Symposium on Ultrasonics, 2003 - Trade off study on different envelope detectors for B-mode imaging

Schlaikjer, M.; Bagge, J.P.; Sorensen, O.M.; Jensen, J.A.

作者Schlaikjer, M.; Bagge, J.P.; Sorensen, O.M.; Jensen, J.A.
卷第2卷
文件大小678.81KB
发表时间2003
DOI10.1109/ULTSYM.2003.1293296
页码1938-1941

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