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[IEEE Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials (Cat No 03CH37417) ATS-03 - Xi'an, China (2003.11.19-2003.11.19)] Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials (Cat No 03CH37417) ATS-03 - A method of test plan grouping to shorten test length for RTL data paths under a test controller area constraint

[IEEE Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials (Cat No 03CH37417) ATS-03 - Xi'an, China (2003.11.19-2003.11.19)] Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials (Cat No 03CH37417) ATS-03 - A method of test plan grouping to shorten test length for RTL data paths under a test controller area constraint

Hosokawa, ; Date, ; Miyazaki, ; Muraoka, ; Fujiwara,
  • 作者Hosokawa, ; Date, ; Miyazaki, ; Muraoka, ; Fujiwara,
  • 文件大小266.28KB
  • 发表时间2003
  • DOI10.1109/ats.2003.1250797
  • 页码130-135
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