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[IEEE IEEE International Electron Devices Meeting 2003 - Washington, DC, USA (8-10 Dec. 2003)] IEEE International Electron Devices Meeting 2003 - Few electron memories: finding the compromise between performance, variability and manufacturability at the nano-scale

[IEEE IEEE International Electron Devices Meeting 2003 - Washington, DC, USA (8-10 Dec. 2003)] IEEE International Electron Devices Meeting 2003 - Few electron memories: finding the compromise between performance, variability and manufacturability at the nano-scale

Silva, H.; Kim, M.K.; Kumar, A.; Avci, U.; Tiwari, S.

作者Silva, H.; Kim, M.K.; Kumar, A.; Avci, U.; Tiwari, S.
文件大小305.38KB
发表时间2003
DOI10.1109/iedm.2003.1269277

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