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[IEEE Comput. Soc ISQED 2003: 4th International Symposium on Quality Electronic Design - San Jose, CA, USA (24-26 March 2003)] Fourth International Symposium on Quality Electronic Design, 2003. Proceedings. - Electrostatic discharge implantation to improve machine-model ESD robustness of stacked NMOS in mixed I/O interface circuits

[IEEE Comput. Soc ISQED 2003: 4th International Symposium on Quality Electronic Design - San Jose, CA, USA (24-26 March 2003)] Fourth International Symposium on Quality Electronic Design, 2003. Proceedings. - Electrostatic discharge implantation to improve machine-model ESD robustness of stacked NMOS in mixed I/O interface circuits

Ming-Dou Ker, ; Hsin-Chyh Hsu, ; Jeng-Jie Peng,
  • 作者Ming-Dou Ker, ; Hsin-Chyh Hsu, ; Jeng-Jie Peng,
  • 文件大小426.16KB
  • 发表时间2003
  • DOI10.1109/isqed.2003.1194759
  • 页码363-368
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