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[IEEE 2003 IEEE LEOS Annual Meeting Conference Proceedings - Tucson, AZ, USA (27-28 Oct. 2003)] The 16th Annual Meeting of the IEEE Lasers and Electro-Optics Society, 2003. LEOS 2003. - Future challenges in IC testing and fault isolation

[IEEE 2003 IEEE LEOS Annual Meeting Conference Proceedings - Tucson, AZ, USA (27-28 Oct. 2003)] The 16th Annual Meeting of the IEEE Lasers and Electro-Optics Society, 2003. LEOS 2003. - Future challenges in IC testing and fault isolation

Vallett, D.P.

作者Vallett, D.P.
卷第2卷
文件大小142.68KB
发表时间2003
DOI10.1109/leos.2003.1252912
页码539-540

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