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[IEEE Nineteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium - San Jose, CA, USA (11-13 March 2003)] Ninteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium, 2003. - Reliability prediction for TFBGA assemblies

[IEEE Nineteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium - San Jose, CA, USA (11-13 March 2003)] Ninteenth Annual IEEE Semiconductor Thermal Measurement and Management Symposium, 2003. - Reliability prediction for TFBGA assemblies

Radivojevic, Z.; Abdul-Quadir, Y.; Myllykoski, P.; Rantala, J.

作者Radivojevic, Z.; Abdul-Quadir, Y.; Myllykoski, P.; Rantala, J.
文件大小438.45KB
发表时间2003
DOI10.1109/stherm.2003.1194382
页码336-340

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