[IEEE Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials (Cat No 03CH37417) ATS-03 - Xi'an, China (2003.11.19-2003.11.19)] Proceedings of the 7th International Conference on Properties and Applications of Dielectric Materials (Cat No 03CH37417) ATS-03 - Error detection and correction in VLSI systems by online testing and retrying

• 作者Jian-Hui Jiang,
• 文件大小176.53KB
• 发表时间2003
• DOI10.1109/ats.2003.1250873