[IEEE Comput. Soc 21st VLSI Test Symposium (VTS 03) - Napa, CA, USA (27 April-1 May 2003)] Proceedings. 21st VLSI Test Symposium, 2003. - Development of energy consumption ratio test
Xiaoyun Sun, ; Kinney, L.; Vinnakota, B.
- 作者Xiaoyun Sun, ; Kinney, L.; Vinnakota, B.
- 文件大小786.42KB
- 发表时间2003
- DOI10.1109/vtest.2003.1197664
- 页码279-284