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[IEEE 2003 IEEE Radiation Effects Data Workshop - Monterey, CA, USA (21-25 July 2003)] 2003 IEEE Radiation Effects Data Workshop - Variability in measured SEE sensitivity associated with design and fabrication iterations

[IEEE 2003 IEEE Radiation Effects Data Workshop - Monterey, CA, USA (21-25 July 2003)] 2003 IEEE Radiation Effects Data Workshop - Variability in measured SEE sensitivity associated with design and fabrication iterations

Koga, R.; Crain, S.; George, J.; LaLumondiere, S.; Crawford, K.; Yu, P.; Tran, V.
  • 作者Koga, R.; Crain, S.; George, J.; LaLumondiere, S.; Crawford, K.; Yu, P.; Tran, V.
  • 文件大小720.91KB
  • 发表时间2003
  • DOI10.1109/redw.2003.1281348
  • 页码77-82
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