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[IEEE 2003 IEEE Radiation Effects Data Workshop - Monterey, CA, USA (21-25 July 2003)] 2003 IEEE Radiation Effects Data Workshop - Single-event effects test results of 512MB SDRAMs

[IEEE 2003 IEEE Radiation Effects Data Workshop - Monterey, CA, USA (21-25 July 2003)] 2003 IEEE Radiation Effects Data Workshop - Single-event effects test results of 512MB SDRAMs

Langley, T.; Koga, R.; Morris, T.

作者Langley, T.; Koga, R.; Morris, T.
文件大小296.34KB
发表时间2003
DOI10.1109/redw.2003.1281355
页码98-101

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