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[IEEE 2003 IEEE Radiation Effects Data Workshop - Monterey, CA, USA (21-25 July 2003)] 2003 IEEE Radiation Effects Data Workshop - TID, SEE and radiation induced failures in advanced flash memories

[IEEE 2003 IEEE Radiation Effects Data Workshop - Monterey, CA, USA (21-25 July 2003)] 2003 IEEE Radiation Effects Data Workshop - TID, SEE and radiation induced failures in advanced flash memories

Nguyen, D.N.; Scheick, L.Z.

作者Nguyen, D.N.; Scheick, L.Z.
文件大小537.10KB
发表时间2003
DOI10.1109/redw.2003.1281316
页码18-23

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