[IEEE AUTOTESTCON 2003. IEEE Systems Readiness Technology Conference - Anaheim, CA, USA (22-25 Sept. 2003)] Proceedings AUTOTESTCON 2003. IEEE Systems Readiness Technology Conference. - Instrument connectivity through mixed I/O test systems
- 作者Cheij, D.
- 文件大小204.59KB
- 发表时间2003
- DOI10.1109/autest.2003.1243623
- 页码502-504
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Interacting systems for self-correcting low power switchingSalahuddin, Sayeef; Datta, Supriyo · Applied Physics Letters · 2007
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