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[IEEE 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) - Vail, Colorado, USA (20-22 May 2003)] Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) - Methods for the automated selection of test frequencies for fault diagnosis in analog electronic circuits: a comparison

[IEEE 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) - Vail, Colorado, USA (20-22 May 2003)] Proceedings of the 20th IEEE Instrumentation Technology Conference (Cat. No.03CH37412) - Methods for the automated selection of test frequencies for fault diagnosis in analog electronic circuits: a comparison

Alippi, C.; Catelani, M.; Fort, A.; Mugnaini, M.
  • 作者Alippi, C.; Catelani, M.; Fort, A.; Mugnaini, M.
  • 卷第1卷
  • 文件大小317.88KB
  • 发表时间2003
  • DOI10.1109/imtc.2003.1208122
  • 页码60-64
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