Sample Geometry Effects on Electric-Field-Induced Displacements in Piezoelectric Thin Films Measured by Atomic Force Microscopy
- 期刊名称MRS Proceedings
- 作者Okino, Hirotake; Matsuda, Hirofumi; Iijima, Takashi; Yokoyama, Shintaro; Funakubo, Hiroshi; Yamamoto, Takashi
- 卷第784卷
- 电子ISSN1946-4274
- 文件大小289.41KB
- 发表时间2003-1
- DOI10.1557/PROC-784-C11.29
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